Global Leader in ALD Technology
- PRODUCTS
- R&D
- Lucida™ D series ALD
LucidaTM D series ALD
Atomic layer deposition system for R&D applications
- Thin film process for ALD research
: Al2O3, HfO2, ZrO2, TiO2, ZnO ……
- 100~200mm wafers
- Applications of R&D
- Very low price
- ALD ultra-thin high-k dielectric with good thickness uniformity and 100% conformal step coverage
- Advanced process kit and small-volume chamber for short cycle times
- Extremely materialize ALD mechanism (traveling wave method)
- Small foot print
- Totally integrated process module
- Easy process control
- Minimized gas supply line length
Technical Specifications
Substrate Size |
100~200 mm |
Substrate Temperature |
25℃ ~ 350 ℃ (± 0.2 ℃) @ 1Torr, in wafer |
Precursor Sources |
3, heated 2 sources and H2 O source |
Deposition Uniformity |
<±2% |
Footprint |
950 x 700 mm |
Compatibility |
Clean room class 100 |
Control System |
PC control base (full auto) |
Optional |
Up to 4 heated sources |
Optional |
Lucida cooler (2ch) |
More information for application and specification for Lucida™ D series